Surface and bulk electronic structure of thin-film wurtzite GaN

被引:101
作者
Dhesi, SS
Stagarescu, CB
Smith, KE
Doppalapudi, D
Singh, R
Moustakas, TD
机构
[1] BOSTON UNIV,DEPT PHYS,BOSTON,MA 02215
[2] BOSTON UNIV,DEPT ELECT & COMP ENGN,BOSTON,MA 02215
来源
PHYSICAL REVIEW B | 1997年 / 56卷 / 16期
关键词
D O I
10.1103/PhysRevB.56.10271
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The bulk and surface valence-band electronic structure of thin-wurtzite GaN has been studied using angle-resolved photoemission spectroscopy. The bulk band dispersion along the Gamma Delta A, Gamma Sigma M, and Gamma TK directions of the bulk Brillouin zone was measured. Our results indicate the local-density approximation band-structure calculations using partial-core corrections for the Ga 3d states predict the relative dispersion of many of the observed bands with a high degree of accuracy. Furthermore, a nondispersive feature was identified near the valence-band maximum in a region of k space devoid of bulk states. This feature is identified as emission from a surface state on GaN(0001)-(1x1). The symmetry of this surface state is even with respect to the mirror planes of the surface and polarization measurements indicate that it is of sp(z) character, consistent with a dangling-bond state. [S0163-1829(97)03640-0].
引用
收藏
页码:10271 / 10275
页数:5
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