The Astro-E/XRS calibration program and results

被引:8
作者
Gendreau, KC [1 ]
Audley, MD [1 ]
Arnaud, KA [1 ]
Boyce, KR [1 ]
Fujimoto, R [1 ]
Ishisaki, Y [1 ]
Kelley, RL [1 ]
Mihara, T [1 ]
Mitsuda, K [1 ]
Porter, FS [1 ]
Stahle, CK [1 ]
Szymkowiak, AE [1 ]
机构
[1] Univ Maryland, College Pk, MD 20742 USA
来源
EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY X | 1999年 / 3765卷
关键词
X-ray; calibration; calorimeter; spectrometer;
D O I
10.1117/12.366495
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
XRS is the microcalorimeter X-ray detector aboard the US-Japanese ASTRO-E observatory, which is scheduled to be launched in early 2000. XRS is a high resolution spectrometer- with less than 9 eV resolution at 3 keV and better than 14 eV resolution over its bandpass ranging from about 0.3 keV to 15 keV. Here we present the results of our first calibration of the XRS instrument. We describe the methods used to extract detailed information about the detection efficiency and spectral redistribution of the instrument. We also present comparisons of simulations and real data to test our detector models.
引用
收藏
页码:137 / 147
页数:11
相关论文
共 9 条
  • [1] AUDLEY MD, 1999, P SPIE, V1999
  • [2] AN ABUTTABLE CCD IMAGER FOR VISIBLE AND X-RAY FOCAL PLANE ARRAYS
    BURKE, BE
    MOUNTAIN, RW
    HARRISON, DC
    BAUTZ, MW
    DOTY, JP
    RICKER, GR
    DANIELS, PJ
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1991, 38 (05) : 1069 - 1076
  • [3] GENDREAU KC, 1995, THESIS MIT CAMBRIDGE
  • [4] SURFACE NORMAL ROTATION - A NEW TECHNIQUE FOR GRAZING-INCIDENCE MONOCHROMATORS
    HETTRICK, MC
    [J]. APPLIED OPTICS, 1992, 31 (34): : 7174 - 7178
  • [5] HETTRICK MC, 1978, J OPT SOC AM, V68, P1106
  • [6] HETTRICK MC, 1983, APPL OPTICS, V22, P3221
  • [7] KELLEY RL, 1999, P SPIE, V1999
  • [8] OGAWARA Y, 1998, P IAU S, V188
  • [9] STAHLE CK, 1999, P SPIE, V1999