Above-threshold leakage in semiconductor lasers: An analytical physical model

被引:11
作者
Aarts, IMP [1 ]
Sargent, EH [1 ]
机构
[1] Eindhoven Univ Technol, Dept Phys, NL-5600 MB Eindhoven, Netherlands
关键词
analytical model; doping; internal efficiency; overbarrier leakage; semiconductor laser; telecommunication; temperature;
D O I
10.1109/3.831028
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present an analytical physical model for above-threshold leakage in semiconductor lasers, The model can be applied to estimate whether heterobarrier lowering and accompanying overbarrier leakage are within reach of having serious deleterious effects on laser performance. The model uses two-dimensional fully self-consistent numerical equations that arise from comprehensive systems of partial coupled differential equations. The effect of temperature and doping on laser efficiency is analyzed for two lasers, one designed for operation at 1.3 mu m and the other at 1.55 mu m. Both devices are assumed to be built in the InCaAsP-InP material system, We show that, even in a 1.55-mu m laser, overbarrier leakage can cause severe performance degradation at typical operating temperatures and doping levels, and we argue that ol overbarrier leakage deserves to be treated as a potential threat to laser performance at telecommunication wavelengths.
引用
收藏
页码:496 / 501
页数:6
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