Correction of self-absorption spectral line and ratios of transition probabilities for homogeneous and LTE plasma

被引:75
作者
Amamou, H
Bois, A
Ferhat, B
Redon, R
Rossetto, B
Matheron, P
机构
[1] Univ Toulon & Var, Lab Opt Appl, F-83957 La Garde, France
[2] USTHB, Inst Phys, El Alia Dar El Beida Alg, Algeria
关键词
plasma laser spectroscopy; self-absorption; optical thickness; transition probabilities; silicon multiple lines; Doppler effect; Stark effect;
D O I
10.1016/S0022-4073(02)00040-7
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Expressions for fundamental spectral line parameters are reported for Gaussian and Lorentzian shape profiles for homogeneous plasma at equilibrium in presence of the self-absorption. These expressions for Lorentzian proefiles are applied to the determination of the ratios of transition probabilities and the ratios of optical thicknesses by a new method that we propose in this article. The self-absorption is computed by spectral line profiles with a Simplex algorithm program fitting. Applications to some experimental lines illustrate the appropriate corrections. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:747 / 763
页数:17
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