Fine-structure constant obtained from an improved calculation of the electron g-2

被引:35
作者
Kinoshita, T
机构
[1] Newman Laboratory, Cornell University, Ithaca
基金
美国国家科学基金会;
关键词
electron moment anomaly; fine-structure constant quantum electrodynamics;
D O I
10.1109/19.571785
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A preliminary result is presented for an accurate determination of the fine-structure constant alpha based on an improved evaluation of the sixth- and eighth-order radiative corrections to the electron anomalous magnetic moment a(epsilon). In combination with a very precise measurement of a(epsilon), this leads to the most accurate value of alpha obtained thus far, with a relative standard uncertainty of less than 4 x 10(-9).
引用
收藏
页码:108 / 111
页数:4
相关论文
共 19 条
[11]   THE ANALYTICAL CONTRIBUTION OF THE 6TH-ORDER GRAPHS WITH VACUUM POLARIZATION INSERTIONS TO THE MUON (G-2) IN QED [J].
LAPORTA, S .
NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA A-NUCLEI PARTICLES AND FIELDS, 1993, 106 (05) :675-683
[12]   THE ANALYTICAL VALUE OF THE CORNER-LADDER GRAPHS CONTRIBUTION TO THE ELECTRON (G-2) IN QED [J].
LAPORTA, S .
PHYSICS LETTERS B, 1995, 343 (1-4) :421-426
[13]   THE ANALYTICAL VALUE OF THE ELECTRON LIGHT LIGHT GRAPHS CONTRIBUTION TO THE MUON (G-2) IN QED [J].
LAPORTA, S ;
REMIDDI, E .
PHYSICS LETTERS B, 1993, 301 (04) :440-446
[14]  
LEPAGE GP, 1978, J COMPUT PHYS, V27, P192
[15]   METROLOGICAL ACCURACY OF THE ELECTRON PUMP [J].
MARTINIS, JM ;
NAHUM, M ;
JENSEN, HD .
PHYSICAL REVIEW LETTERS, 1994, 72 (06) :904-907
[16]  
VANDYCK R, 1991, ELECTRON
[17]   NEW HIGH-PRECISION COMPARISON OF ELECTRON AND POSITRON G-FACTORS [J].
VANDYCK, RS ;
SCHWINBERG, PB ;
DEHMELT, HG .
PHYSICAL REVIEW LETTERS, 1987, 59 (01) :26-29
[18]   PRECISION-MEASUREMENT OF THE PHOTON RECOIL OF AN ATOM USING ATOMIC INTERFEROMETRY [J].
WEISS, DS ;
YOUNG, BC ;
CHU, S .
PHYSICAL REVIEW LETTERS, 1993, 70 (18) :2706-2709
[19]   A LOW FIELD DETERMINATION OF THE PROTON GYROMAGNETIC RATIO IN WATER [J].
WILLIAMS, ER ;
JONES, GR ;
YE, S ;
LIU, R ;
SASAKI, H ;
OLSEN, PT ;
PHILLIPS, WD ;
LAYER, HP .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (02) :233-237