A practical method for the analysis of overlapped peaks in energy dispersive X-ray spectra

被引：43

作者：

Sahin, Y

Karabulut, A

Budak, G

机构：

[1] Atatürk University, Faculty of Arts and Sciencies, Department of Physics

来源：

APPLIED SPECTROSCOPY REVIEWS | 1996年 / 31卷 / 03期

关键词：

D O I：

10.1080/05704929608000573

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

In this study a practical method for the spectral analysis of some overlapped characteristic X-ray peaks is presented. The overlapped characteristic K-alpha and K-beta peaks and the artificially overlapped two K-alpha peaks (peak doublet) of arsenic obtained by the radioisotope-excited, energy dispersive X-ray fluorescence (EDXRF) technique, are resolved. A total of 34 overlapped peak systems were investigated: the proposed method provided 18 reliable results, whereas the first and the second methods gave 15 and 1, respectively. The intensity ratios of K-beta/K-alpha obtained by the novel method are also in good agreement with the theoretical relativistic Hartree-Slater values.

引用

页码：333 / 345

页数：13

共 16 条

[1]

Bertin E.P., 1975, Principles and Practice of X-ray Spectrometric Analysis

[2] IMPROVED MODEL FOR THE INTENSITY OF LOW-ENERGY TAILING IN SI(LI) X-RAY-SPECTRA [J].