ANALYTICAL FUNCTIONS FOR FITTING PEAKS FROM GE SEMICONDUCTOR-DETECTORS

被引:44
作者
HELMER, RG
LEE, MA
机构
来源
NUCLEAR INSTRUMENTS & METHODS | 1980年 / 178卷 / 2-3期
关键词
D O I
10.1016/0029-554X(80)90830-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:499 / 512
页数:14
相关论文
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