PRECISE RELATIVE GAMMA-RAY INTENSITIES FOR CALIBRATION OF GE SEMICONDUCTOR-DETECTORS

被引：178

作者：

GEHRKE, RJ ^{[1
]}

HELMER, RG ^{[1
]}

GREENWOOD, RC ^{[1
]}

机构：

[1] EG&G IDAHO INC,IDAHO NATL ENGN,IDAHO FALLS,ID 83401

来源：

NUCLEAR INSTRUMENTS & METHODS | 1977年 / 147卷 / 02期

关键词：

D O I：

10.1016/0029-554X(77)90276-2

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：405 / 423

页数：19

共 68 条

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