First application of Cc-corrected imaging for high-resolution and energy-filtered TEM

被引：86

作者：

Kabius, Bernd ^{[1
]}

Hartel, Peter ^{[2
]}

Haider, Maximilian ^{[2
]}

Mueller, Heiko ^{[2
]}

Uhlemann, Stephan ^{[2
]}

Loebau, Ulrich ^{[2
]}

Zach, Joachim ^{[2
]}

Rose, Harald ^{[3
]}

机构：

[1] Argonne Natl Lab, Argonne, IL 60439 USA

[2] CEOS GmbH, D-69126 Heidelberg, Germany

[3] Tech Univ Darmstadt, D-64289 Darmstadt, Germany

来源：

JOURNAL OF ELECTRON MICROSCOPY | 2009年 / 58卷 / 03期

关键词：

aberration correction; chromatic aberration; oxides; EFTEM; HRTEM;

D O I：

10.1093/jmicro/dfp021

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Contrast-transfer calculations indicate that C-c correction should be highly beneficial for high-resolution and energy-filtered transmission electron microscopy. A prototype of an electron optical system capable of correcting spherical and chromatic aberration has been used to verify these calculations. A strong improvement in resolution at an acceleration voltage of 80 kV has been measured. Our first C-c-corrected energy-filtered experiments examining a (LaAlO3)(0.3)(Sr2AlTaO6)(0.7)/LaCoO3 interface demonstrated a significant gain for the spatial resolution in elemental maps of La.

引用

页码：147 / 155

页数：9

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