Time-of-flight measurement of lateral carrier mobility in organic thin films

被引：36

作者：

Kitamura, M

Imada, T

Kako, S

Arakawa, Y

机构：

[1] Univ Tokyo, Adv Sci & Technol Res Ctr, Meguro Ku, Tokyo 1538504, Japan

[2] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2004年 / 43卷 / 4B期

关键词：

organic semiconductor; time of flight; drift mobility; lateral carrier transport; copper phthalocyanine;

D O I：

10.1143/JJAP.43.2326

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Lateral carrier transport in a copper phthalocyanine (CuPc) thin film has been investigated by the time-of-flight technique using a micro-excitation system. Drift mobility in the CuPc film has been estimated from the transient photocurrent measured for various electric field strengths. The drift mobility has been compared to the field-effect mobility of a thin-film transistor with CuPc as the channel material. The field-effect mobility was comparable to the drift mobility measured by the TOF technique.

引用

页码：2326 / 2329

页数：4

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