Electronic structure near the Fermi level of the organic semiconductor copper phthalocyanine

被引：45

作者：

Downes, JE ^{[1
]}

McGuinness, C ^{[1
]}

Glans, PA ^{[1
]}

Learmonth, T ^{[1
]}

Fu, DF ^{[1
]}

Sheridan, P ^{[1
]}

Smith, KE ^{[1
]}

机构：

[1] Boston Univ, Dept Phys, Boston, MA 02215 USA

来源：

CHEMICAL PHYSICS LETTERS | 2004年 / 390卷 / 1-3期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/j.cplett.2004.04.026

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The electronic structure of thin films of the prototypical organic semiconductor copper phthalocyanine (CuPc) has been measured using resonant soft X-ray emission spectroscopy. We report the observation of two discrete states near E-F. This differs from published photoemission results, but is in excellent agreement with density functional calculations. The implications of this result for the use of resonant soft X-ray emission (SXE) in the study of organic semiconductors are discussed. We also compare our data to published X-ray emission results, and show that the latter display clear evidence of beam damage. (C) 2004 Elsevier B.V. All rights reserved.

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页码：203 / 207

页数：5

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