RESONANT EXCITATION X-RAY-FLUORESCENCE FROM C-60

被引：36

作者：

GUO, JH

GLANS, P

SKYTT, P

WASSDAHL, N

NORDGREN, J

LUO, Y

AGREN, H

MA, Y

WARWICK, T

HEIMANN, P

ROTENBERG, E

DENLINGER, JD

机构：

[1] LINKOPING UNIV, DEPT PHYS & MEASUREMENT TECHNOL, S-58183 LINKOPING, SWEDEN

[2] UNIV WASHINGTON, DEPT PHYS, SEATTLE, WA 98195 USA

[3] PACIFIC NW LAB, MOLEC SCI RES CTR, RICHLAND, WA 99352 USA

[4] LAWRENCE BERKELEY LAB, BERKELEY, CA 94720 USA

[5] UNIV OREGON, DEPT PHYS, EUGENE, OR 97403 USA

[6] UNIV WISCONSIN, DEPT PHYS, MILWAUKEE, WI 53211 USA

来源：

PHYSICAL REVIEW B | 1995年 / 52卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.52.10681

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray fluorescence of condensed C-60 has been recorded in high resolution using monochromatic synchrotron radiation excitation. Strong intensity modulation of constituent spectral features is observed with varying excitation energy up to 10 eV above threshold. The energy dependence is interpreted as due to resonant inelastic x-ray scattering, leading to symmetry selection rules governing the two-photon process in the fully symmetric molecule.

引用

页码：10681 / 10684

页数：4

共 34 条

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