High-resolution three-dimensional imaging of dislocations

被引：120

作者：

Barnard, J. S. ^{[1
]}

Sharp, J. ^{[1
]}

Tong, J. R. ^{[1
]}

Midgley, P. A. ^{[1
]}

机构：

[1] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England

来源：

SCIENCE | 2006年 / 313卷 / 5785期

关键词：

D O I：

10.1126/science.1125783

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Weak-beam transmission electron microscopy and tomographic reconstruction reveals, in three dimensions, atomic dislocations within materials at very high resolution.

引用

页码：319 / 319

页数：1

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