X-ray powder diffraction data for indium nitride

被引：67

作者：

Paszkowicz, W ^{[1
]}

机构：

[1] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

来源：

POWDER DIFFRACTION | 1999年 / 14卷 / 04期

关键词：

D O I：

10.1017/S0885715600010630

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray powder diffraction pattern for InN synthesized using a microwave plasma source of nitrogen is reported. The data were obtained with the help of an automated Bragg-Brentano diffractometer using Ni-filtered CuK alpha radiation. The lattice parameters for the wurtzite-type unit cell are a(o)=3.5378(1) Angstrom, c(o)=5.7033(1)Angstrom. The calculated density is 6.921+/-0.002 g/cm(3) (C) 1999 International Centre for Diffraction Data. [S0885-7156(99)00902-1].

引用

页码：258 / 260

页数：3

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