Structural Stability and Variable Dielectric Constant in Poly Sodium 4-Styrensulfonate Intercalated Graphite Oxide

被引:60
作者
Jeong, Hae-Kyung [1 ]
Jin, Mei Hua [1 ]
An, Kay Hyeok [2 ]
Lee, Young Hee [1 ]
机构
[1] Sungkyunkwan Univ, Inst Basic Sci, Dept Phys,Sungkyunkwan Adv Inst Nanotechnol, Dept Energy Sci,Ctr Nanotubes & Nanostructured Co, Suwon 440746, South Korea
[2] Jeonju Machinery Res Ctr, Jeonju 561844, South Korea
关键词
COMPOSITE FILMS;
D O I
10.1021/jp9026282
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The structural stability and dielectric constant of poly sodium 4-styrensulfonate (PSS) intercalated graphite oxides (GOs) were investigated. We found that the interlayer distance of a PSS-treated graphite oxide increased by about 1 angstrom compared to that of the precursor graphite oxide. This increase in interlayer spacing was attributed to the intercalation of a monolayer of planar PSS into the graphite oxide interlayers facilitated by a pi-pi interaction between the aromatic rings of the graphite oxide and PSS. The PSS-intercalated graphite oxide had a higher structural stability than the pristine graphite oxide during thermal treatment because of the high melting point of PSS. Furthermore, the dielectric constant of the PSS-intercalated graphite oxide increased significantly at temperatures between 20 and 100 degrees C, and both of the GO and PSS-GO samples had dielectric constants that varied as a function of temperature due to their hydrophilicity.
引用
收藏
页码:13060 / 13064
页数:5
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