Density-of-states in microcrystalline silicon from thermally-stimulated conductivity

被引:2
作者
Souffi, N. [1 ]
Bauer, G. H. [1 ]
Brueggemann, R. [1 ]
机构
[1] Carl Von Ossietzky Univ Oldenburg, Inst Phys, D-26111 Oldenburg, Germany
关键词
electrical and electronic properties; thermally-stimulated and depolarization current; defects;
D O I
10.1016/j.jnoncrysol.2005.10.039
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The technique of thermally-stimulated currents has been applied to extract the density-of-states profile in microcrystalline silicon. Exploiting the experimental parameter space a consistent density-of-states profile emerges with an exponential conduction band tail and a broader deeper distribution. Calibrating the absolute density-of-states profile from other techniques like modulated photoconductivity, steady-state photocarrier grating technique and intensity-dependent photoconductivity allows a determination of the capture coefficient of the probed localized states. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1109 / 1112
页数:4
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