Light-intensity dependence of the steady-state photoconductivity used to estimate the density of states in the gap of intrinsic semiconductors

被引:4
作者
Schmidt, JA [1 ]
Longeaud, C
Kleider, JP
机构
[1] UNL, CONICET, INTEC, RA-3000 Santa Fe, Argentina
[2] UNL, FIQ, RA-3000 Santa Fe, Argentina
[3] Univ Paris 06, Ecole Super Elect, UMR 8507, Lab Genie Elect Paris,CNRS, F-91192 Gif Sur Yvette, France
[4] Univ Paris 11, F-91192 Gif Sur Yvette, France
关键词
semiconductors; photoconductivity; density of states; electrical properties and measurements;
D O I
10.1016/j.tsf.2005.08.060
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a method to obtain the density of states of photoconductive semiconductors based on the light-intensity dependence of the steady-state photoconductivity. A simple expression-relating the density of states at the electron quasi-Fermi level to measurable quantities-is deduced by performing suitable approximations from the analytical solution of the generalized equations that describe the photoconductivity of semiconductors. The validity of the approximations and the applicability of the final expression are verified from numerical simulations of the process. The usefulness of the method is demonstrated by performing measurements on a standard hydrogenated amorphous silicon sample. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:319 / 324
页数:6
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