Effect of ion diffusion on switching voltage of solid-electrolyte nanometer switch

被引:55
作者
Banno, Naoki [1 ]
Sakamoto, Toshitsuyu
Hasegawa, Tsuyoshi
Terabe, Kazuya
Aono, Masakazu
机构
[1] NEC Corp Ltd, Fundamental & Environm Res Labs, Tsukuba, Ibaraki 3058501, Japan
[2] Japan Sci & Technol Agcy, ICORP, Kawaguchi, Saitama 3320012, Japan
[3] NIMS, Nanomat Lab, Tsukuba, Ibaraki 3050003, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2006年 / 45卷 / 4B期
关键词
solid electrolyte; electrochemical reaction; ion diffusion; programmable logic;
D O I
10.1143/JJAP.45.3666
中图分类号
O59 [应用物理学];
学科分类号
摘要
A solid electrolyte switch turns on or off when a metallic bridge is formed or dissolved respectively in the solid electrolyte (here we use Cu2-alpha S). For logic applications, the switching voltage (< 0.3 V) should be larger than the operating voltage of the logic circuit (about I V). We reveal that the switching voltage is mainly affected by Cu+ ionic transport in Cu2-alpha S and that a solid electrolyte with an ion diffusion coefficient smaller than that of Cu2-alpha S by several tens of orders of magnitude makes it possible to increase the switching voltage to I V.
引用
收藏
页码:3666 / 3668
页数:3
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