Testing microcomponents by speckle interferometry

被引:16
作者
Aswendt, P [1 ]
Höfling, R [1 ]
Hiller, K [1 ]
机构
[1] Fraunhofer Inst IWU, Microfabricat Ctr, Chemnitz, Germany
来源
MICROSYSTEMS METROLOGY AND INSPECTION | 1999年 / 3825卷
关键词
speckle interferometry; vibration; deformation; microscopy; microsensors; MEMS testing;
D O I
10.1117/12.364298
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Design, manufacturing and test of microcomponents generate new challenges for measurement techniques in general. The non-contacting operation of optical, metrology makes it attractive to solve the task of measuring geometric quantities of microparts. So far, speckle interferometry (ESPI) is well established as a measuring tool for analyzing deformation, vibration and strain on a macroscopic level. This paper deals with possibilities and application limits of ESPI in the case of scaling down the object size below one millimeter. In a first part, both spatial resolution and displacement sensitivity of the technique are discussed. Theoretical considerations are shown together with experimental verification. Secondly, a micro speckle interferometer will be presented that has been built for the the use with different microscopes. Its capabilities are demonstrated by a practical application. The microcomponent under investigation is a bulk micromachined gyroscope, a demanding object with respect to its multilayer design. Developments aim at increasing the spatial resolution step by step and results obtained with different field of view will demonstrate the progress. Finally, the deformation behaviour of an X-shaped torsional spring with a width of 100 mu m could be characterized.
引用
收藏
页码:165 / 173
页数:9
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