Free volume behavior in spincast thin film of polystyrene by energy variable positron annihilation lifetime spectroscopy

被引：28

作者：

Ata, S. ^{[1
]}

Muramatsu, M. ^{[1
,2
]}

Takeda, J. ^{[1
]}

Ohdaira, T. ^{[1
]}

Suzuki, R. ^{[2
]}

Ito, K. ^{[2
]}

Kobayashi, Y. ^{[2
]}

Ougizawa, T. ^{[1
]}

机构：

[1] Tokyo Inst Technol, Dept Organ & Polymer Mat, Meguro Ku, Tokyo 1528552, Japan

[2] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058565, Japan

来源：

POLYMER | 2009年 / 50卷 / 14期

关键词：

Polystyrene thin film; Free volume; Positron annihilation lifetime spectroscopy; GLASS-TRANSITION TEMPERATURE; INCOHERENT NEUTRON-SCATTERING; POLYMER-FILMS; DYNAMICS; SURFACE; SIZE; PERMEABILITY; EXPANSION; DENSITY; PROBE;

D O I：

10.1016/j.polymer.2009.04.060

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Free volume behavior in polystyrene thin films with thickness ranging from 22 to 1200 nm on silicon substrates was studied by energy variable positron annihilation lifetime spectroscopy (EVPALS). The films were prepared by spincasting from toluene solutions of 0.5-5.0 wt% polystyrene with M-w = 1090 000 g/mol. Distinct deviations from bulk polystyrene in thermal expansion of the free volume holes and the glass transition temperature associated with free volume behavior were observed for the thinnest film with 22 nm thickness, indicating its exclusively high chain mobility. Comparison of the polystyrene concentration in the precursor solution around the overlap concentration suggests that the high chain mobility is due to less entangled chains caused by rapid removal of the solvent from the diluted solution in order to prepare very thin film. (C) 2009 Elsevier Ltd. All rights reserved.

引用

页码：3343 / 3346

页数：4

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