Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films

Thin films of the multiferroic perovskite-type oxide BiFeO3 were processed via solution deposition. The annealing schedule was chosen so as to give large and fine grained thin films. Microstructure, polarization, and dielectric properties are reported. It is shown that the large grained film is characterized by poor dielectric properties. Both microstructures show, however, poor polarization characteristics. Surface scanning potential microscopy reveals areas of high and low surface potentials in both specimens with a pronounced effect in the large grained films. It is thought that these areas are indirectly responsible for the poor polarization properties of the processed BiFeO3 films. (c) 2006 American Institute of Physics.