A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

被引：28

作者：

Bielefeldt, H ^{[1
]}

Giessibl, FJ ^{[1
]}

机构：

[1] Univ Augsburg, Inst Phys, Ctr Elect Correlat & Magnetism, D-86135 Augsburg, Germany

来源：

SURFACE SCIENCE | 1999年 / 440卷 / 03期

关键词：

atomic force microscopy; intermittent contact; tapping mode;

D O I：

10.1016/S0039-6028(99)00861-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip-sample force for large-amplitude frequency-modulation atomic force microscopy, amplitude and phase versus distance curves are calculated for the intermittent contact mode, and the forces on the substrate are calculated. The results show a qualitative agreement with numerical calculations, yielding typical maximal forces of 50-150 nN. When working above the unperturbed resonance, forces are found to be significantly larger than below the resonance. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：L863 / L867

页数：5

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