Photoinduced dehydrogenation of defects in undoped a-Si:H using positron annihilation spectroscopy

被引:35
作者
Zou, X
Chan, YC
Webb, DP
Lam, YW
Hu, YF
Beling, CD
Fung, S
Weng, HM
机构
[1] City Univ Hong Kong, Dept Elect Engn, Kowloon, Peoples R China
[2] Univ Hong Kong, Dept Phys, Hong Kong, Peoples R China
[3] Univ Sci & Technol China, Dept Modern Phys, Hefei 230026, Peoples R China
关键词
D O I
10.1103/PhysRevLett.84.769
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report changes in variable-energy positron annihilation spectroscopy measurements on undoped hydrogenated amorphous silicon films after light soaking. The change, seen predominantly in the high momentum band of the annihilation radiation, is not reversed by thermal annealing. We suggest, following recent models of the Staebler-Wronski effect, that light exposure induces hydrogen trapped in vacancylike defects to become mobile in the Si network. The observations place constraints on models of hydrogen motion fitting macroscopic Staebler-Wronski effect kinetics and may help to achieve a definitive description of metastability in a-Si:H.
引用
收藏
页码:769 / 772
页数:4
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