DC electrical resistivity measurements in solids: How to proceed correctly

被引:80
作者
Girotto, EM
Santos, IA
机构
[1] Univ Fed Sao Carlos, Inst Quim, BR-13560970 Sao Carlos, SP, Brazil
[2] Univ Fed Sao Carlos, Dept Fis, BR-13565905 Sao Carlos, SP, Brazil
来源
QUIMICA NOVA | 2002年 / 25卷 / 04期
关键词
resistivity; conductivity; four-point probe method; correction factors;
D O I
10.1590/S0100-40422002000400019
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
DC ELECTRICAL RESISTIVITY MEASUREMENTS IN SOLIDS: HOW TO PROCEED CORRECTLY. This paper deals with the most common methods for determining the dc electrical resistivity in solid materials. A brief overview of the fundamental concepts related to the electrical resistivity on materials is introduced. Undoubtedly, the most common and useful procedure to determine the electrical resistivity (p) is the four-point probe method. Some crucial mistakes regarding the experimental procedure and the appropriated correction factors are found in the literature. Thus, the correction factor for the most common sample geometries were gathered and revised in order to provide an easy way to use and apply them.
引用
收藏
页码:639 / 647
页数:9
相关论文
共 22 条
[1]  
[Anonymous], [No title captured]
[2]   Single-electron transport in ropes of carbon nanotubes [J].
Bockrath, M ;
Cobden, DH ;
McEuen, PL ;
Chopra, NG ;
Zettl, A ;
Thess, A ;
Smalley, RE .
SCIENCE, 1997, 275 (5308) :1922-1925
[3]  
Boggild P, 2000, ADV MATER, V12, P947, DOI 10.1002/1521-4095(200006)12:13<947::AID-ADMA947>3.0.CO
[4]  
2-7
[5]   PHOTOREFRACTIVE IMAGING OF SEMICONDUCTOR WAFERS [J].
BYLSMA, RB ;
OLSON, DH ;
GLASS, AM .
APPLIED PHYSICS LETTERS, 1988, 52 (13) :1083-1085
[6]   TECHNIQUE FOR CONDUCTIVITY MEASUREMENTS ON SINGLE-CRYSTALS OF ORGANIC MATERIALS [J].
COLEMAN, LB .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1975, 46 (08) :1125-1126
[7]   Mass transport in intrinsically conducting polymers: Importance, techniques and theoretical models. [J].
Girotto, EM ;
De Paoli, MA .
QUIMICA NOVA, 1999, 22 (03) :358-368
[8]   Characterization of YBCO superconducting films fabricated by pulsed laser deposition [J].
Kim, SM ;
Lee, SY .
THIN SOLID FILMS, 1999, 355 :461-464
[9]  
KITTEL C, 1996, INTRO SOLID STATE PH, P156
[10]   In situ measurement of thickness dependent electrical resistance of ultrathin Co films on SiO2/Si(111) substrate [J].
Li, M ;
Zhao, YP ;
Wang, GC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2000, 18 (06) :2992-2996