Quantum chemical study of the elementary reactions in zirconium oxide atomic layer deposition

被引:54
作者
Widjaja, Y
Musgrave, CB [1 ]
机构
[1] Stanford Univ, Dept Chem Engn, Stanford, CA 94305 USA
[2] Stanford Univ, Dept Mat Sci & Engn, Stanford, CA 94305 USA
关键词
D O I
10.1063/1.1490415
中图分类号
O59 [应用物理学];
学科分类号
摘要
Elementary reactions in atomic layer deposition of zirconia using zirconium tetrachloride and water are investigated using the density functional theory. The atomistic mechanisms of the two deposition half cycles on the Zr-OH and Zr-Cl surface sites are investigated. Both half reactions proceed through the formation of stable intermediates, resulting in high barriers for HCl formation. We find that the intermediate stability is lowered as the surface temperature is raised. However, increasing temperature also increases the dissociation free-energy barrier, which in turn results in increased desorption of adsorbed precursors. (C) 2002 American Institute of Physics.
引用
收藏
页码:304 / 306
页数:3
相关论文
共 10 条
[1]   DENSITY-FUNCTIONAL THERMOCHEMISTRY .3. THE ROLE OF EXACT EXCHANGE [J].
BECKE, AD .
JOURNAL OF CHEMICAL PHYSICS, 1993, 98 (07) :5648-5652
[2]   Scaling the gate dielectric: Materials, integration, and reliability [J].
Buchanan, DA .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1999, 43 (03) :245-264
[3]   ON THE ACCURACY OF GRADIENT-CORRECTED DENSITY-FUNCTIONAL METHODS FOR TRANSITION-METAL COMPLEXES [J].
ERIKSSON, LA ;
PETTERSSON, LGM ;
SIEGBAHN, PEM ;
WAHLGREN, U .
JOURNAL OF CHEMICAL PHYSICS, 1995, 102 (02) :872-878
[4]  
Frisch M.J., 2016, Gaussian 16 Revision C. 01. 2016, V16, P01
[5]   Surface chemistry for atomic layer growth [J].
George, SM ;
Ott, AW ;
Klaus, JW .
JOURNAL OF PHYSICAL CHEMISTRY, 1996, 100 (31) :13121-13131
[6]  
HAY PJ, 1985, J CHEM PHYS, V82, P299, DOI [10.1063/1.448800, 10.1063/1.448799]
[7]   ADSORPTION OF ARGON, NITROGEN, AND WATER-VAPOR ON ZIRCONIUM OXIDE [J].
HOLMES, HF ;
FULLER, EL ;
BEH, RA .
JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1974, 47 (02) :365-371
[8]   Effect of water dose on the atomic layer deposition rate of oxide thin films [J].
Matero, R ;
Rahtu, A ;
Ritala, M ;
Leskelä, M ;
Sajavaara, T .
THIN SOLID FILMS, 2000, 368 (01) :1-7
[9]   ZIRCONIUM DIOXIDE THIN-FILMS DEPOSITED BY ALE USING ZIRCONIUM TETRACHLORIDE AS PRECURSOR [J].
RITALA, M ;
LESKELA, M .
APPLIED SURFACE SCIENCE, 1994, 75 (1-4) :333-340
[10]   THEORETICAL-STUDY OF THE ACTIVATION OF THE O-H BOND IN WATER BY 2ND-ROW TRANSITION-METAL ATOMS [J].
SIEGBAHN, PEM ;
BLOMBERG, MRA ;
SVENSSON, M .
JOURNAL OF PHYSICAL CHEMISTRY, 1993, 97 (11) :2564-2570