Multiple scattering EXAFS and EXELFS study of Al3Ti and Ti3Al alloys

被引:1
作者
Sikora, T
Hug, G
Jaouen, M
Rehr, JJ
机构
[1] URA 131 CNRS,MET PHYS LAB,F-86960 FUTUROSCOPE,FRANCE
[2] UNIV WASHINGTON,SEATTLE,WA 98195
来源
JOURNAL DE PHYSIQUE IV | 1997年 / 7卷 / C2期
关键词
D O I
10.1051/jp4/1997176
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Extended X-ray absorption Fine Structure (EXAFS) and Extended Energy Loss Fine Structure (EXAFS) spectroscopies have been used to study the local atomic order of Al3Ti and Ti3Al. Using the multiple scattering code FEFF6, we will show that now EXAFS can be considered as a probe for medium range order studies. The limitations of this new way of using EXAFS are briefly discussed.
引用
收藏
页码:231 / 232
页数:2
相关论文
共 5 条
[1]  
[Anonymous], PHYSICA B
[2]  
EGERTON RF, 1986, ELECTRON ENERGY LOSS, P247
[3]   SAMPLING DEPTH IN CONVERSION-ELECTRON DETECTION USED FOR X-RAY ABSORPTION [J].
GIRARDEAU, T ;
MIMAULT, J ;
JAOUEN, M ;
CHARTIER, P ;
TOURILLON, G .
PHYSICAL REVIEW B, 1992, 46 (11) :7144-7152
[4]   SIMULATION OF THE EXTENDED FINE-STRUCTURE OF K-SHELL EDGES IN INTERMETALLIC ORDERED ALLOYS [J].
HUG, G ;
BLANCHE, G ;
JAOUEN, M ;
FLANK, AM ;
REHR, JJ .
ULTRAMICROSCOPY, 1995, 59 (1-4) :121-136
[5]   MULTIPLE-SCATTERING CALCULATIONS OF X-RAY-ABSORPTION SPECTRA [J].
ZABINSKY, SI ;
REHR, JJ ;
ANKUDINOV, A ;
ALBERS, RC ;
ELLER, MJ .
PHYSICAL REVIEW B, 1995, 52 (04) :2995-3009