SAMPLING DEPTH IN CONVERSION-ELECTRON DETECTION USED FOR X-RAY ABSORPTION

被引：47

作者：

GIRARDEAU, T ^{[1
]}

MIMAULT, J ^{[1
]}

JAOUEN, M ^{[1
]}

CHARTIER, P ^{[1
]}

TOURILLON, G ^{[1
]}

机构：

[1] LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

PHYSICAL REVIEW B | 1992年 / 46卷 / 11期

关键词：

D O I：

10.1103/PhysRevB.46.7144

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Several x-ray-absorption K thresholds have been measured for thin-film specimens in helium gas. The data are analyzed in terms of the different types of electrons that are ejected out of atomic cores in x-ray-absorption events and their relative contribution to the output signal. Theoretical expressions are derived that predict the K-edge yield as a function of the thickness, density, and atomic concentration of the specimen and as a function of the K-edge nature. Fits yield values of the coefficients in these expressions for samples irradiated with x rays with energy in the 5-10-keV range.

引用

页码：7144 / 7152

页数：9

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