Quantifying the elastic deformation behavior of bridged nanobelts

被引：57

作者：

Mai, Wenjie ^{[1
]}

Wang, Zhong Lin ^{[1
]}

机构：

[1] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA

来源：

APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 07期

基金：

美国国家科学基金会; 美国国家航空航天局;

关键词：

D O I：

10.1063/1.2336600

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new approach for quantifying the elastic deformation behavior of one-dimensional nanostructures is presented by fitting the image profile measured using atomic force microscopy in contact mode along the entire length of a bridged/suspended nanobelt/nanowire/nanotube under different load forces. Consistently fitting the measured deformation profiles can uniquely determine if the measured data are best explained by either the clamped-clamped beam model or the free-free beam model without preassumption, and it eliminates the uncertainty in defining the central point of the suspended beam, thus, greatly increasing the precision and reliability of the measurements. (c) 2006 American Institute of Physics.

引用

页数：3

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