A Fast Stroud-Based Collocation Method for Statistically Characterizing EMI/EMC Phenomena on Complex Platforms

被引：73

作者：

Bagci, Hakan ^{[1
]}

Yucel, Abdulkadir C. ^{[1
]}

Hesthaven, Jan S. ^{[2
]}

Michielssen, Eric ^{[1
]}

机构：

[1] Univ Michigan, Dept Elect & Comp Sci, Ann Arbor, MI 48109 USA

[2] Brown Univ, Div Appl Math, Providence, RI 02912 USA

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2009年 / 51卷 / 02期

基金：

美国国家科学基金会;

关键词：

Electromagnetic coupling; electromagnetic interference and compatibility (EMI/EMC); fast solvers; hybrid simulators; stochastic collocation; Stroud integration rules; time-domain integral equations; EFFICIENT COMPUTATION; CROSSTALK; FIELDS;

D O I：

10.1109/TEMC.2009.2015056

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];

摘要：

A fast stochastic collocation method for statistically characterizing electromagnetic interference and compatibility (EMI/EMC) phenomena on electrically large and loaded platforms is presented. Uncertainties in electromagnetic excitations and/or system geometries and configurations are parameterized in terms of random variables having normal or beta probability density functions. A fast time-domain integral-equation-based field-cable-circuit simulator is used to perform deterministic EMI/EMC simulations for excitations and/or system geometries and configurations specified by Stroud integration rules. Outputs of se simulations then are processed to compute averages and standard deviations of pertinent observables. The proposed Stroud-based collocation method requires far fewer deterministic simulations than Monte Carlo or tensor-product integrators. To demonstrate the accuracy, efficiency, and practicality of the proposed method, it is used to statistically characterize coupled voltages at the feed pins of cable-interconnected and shielded computer cards as well as the terminals of cables situated inside the bay of an airplane cockpit.

引用

页码：301 / 311

页数：11

共 39 条

[11]

Computational modeling of uncertainty in time-domain electromagnetics [J].