Structural refinement of X-ray diffraction profile for artificial superlattices

被引:30
作者
Ishibashi, Y [1 ]
Ohashi, N [1 ]
Tsurumi, T [1 ]
机构
[1] Tokyo Inst Technol, Dept Inorgan Mat, Grad Sch Sci & Engn, Meguro Ku, Tokyo 1528552, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 01期
关键词
X-ray diffraction; artificial superlattice; BaTiO3; SrTiO3; interdiffusion; lattice distortion;
D O I
10.1143/JJAP.39.186
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new structural refinement process for BaTiO3/SrTiO3 (BTO/STO) artificial superlattices was proposed, taking into account the effect of interdiffusion between BTO and STO. The samples were prepared using the molecular beam epitaxy (MBE) method on SrTiO3(001) substrates at 600 degrees C. The step model, the phonon model and the supercell model were employed for simulation of the X-ray diffraction (XRD) profiles of the superlattices. The supercell model can deal with arbitrary variations of chemical composition and lattice spacing. A discrepancy in the intensity of satellite peaks was observed when the interdiffusion between BTO and STO was not incorporated in the simulation. In the phonon model, the concentration profile due to interdiffusion was first calculated using Fick's second law, and the coefficient of Fourier series describing the lattice distortion and modulation of the structure factor was determined. The XRD profiles thus simulated almost agreed with the observed ones, but the intensity of Laue peaks was not consistent with the observation. The degree of interdiffusion at each interface was then changed. throughout the superstructures using the supercell model, and it was shown that the accuracy of simulation improved markedly.
引用
收藏
页码:186 / 191
页数:6
相关论文
共 29 条
[1]  
Afanas'ev AM, 1998, CRYSTALLOGR REP+, V43, P129
[2]   Pulsed laser deposition of SrCuO2/CaCuO2 superlattices [J].
Aruta, C ;
Balestrino, G ;
Desfeux, R ;
Martellucci, S ;
Paoletti, A ;
Petrocelli, G .
APPLIED PHYSICS LETTERS, 1996, 68 (07) :926-928
[3]   Long-range ferroelectric interactions in KTaO3/KNbO3 superlattice structures [J].
Christen, HM ;
Specht, ED ;
Norton, DP ;
Chisholm, MF ;
Boatner, LA .
APPLIED PHYSICS LETTERS, 1998, 72 (20) :2535-2537
[4]   SUPERLATTICE AND NEGATIVE DIFFERENTIAL CONDUCTIVITY IN SEMICONDUCTORS [J].
ESAKI, L ;
TSU, R .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1970, 14 (01) :61-&
[5]  
ESAKI L, 1971, P 12 INT C LOW TEMP, P511
[6]   X-RAY-DIFFRACTION STUDY OF INTER-DIFFUSION AND GROWTH IN (GAAS)N(AIAS)M MULTILAYERS [J].
FLEMING, RM ;
MCWHAN, DB ;
GOSSARD, AC ;
WIEGMANN, W ;
LOGAN, RA .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (01) :357-363
[7]   STRUCTURAL ASPECTS OF FE-MG ARTIFICIAL SUPERSTRUCTURE FILMS STUDIED BY X-RAY-DIFFRACTION [J].
FUJII, Y ;
OHNISHI, T ;
ISHIHARA, T ;
YAMADA, Y ;
KAWAGUCHI, K ;
NAKAYAMA, N ;
SHINJO, T .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1986, 55 (01) :251-262
[8]   STRUCTURAL REFINEMENT OF SUPERLATTICES FROM X-RAY-DIFFRACTION [J].
FULLERTON, EE ;
SCHULLER, IK ;
VANDERSTRAETEN, H ;
BRUYNSERAEDE, Y .
PHYSICAL REVIEW B, 1992, 45 (16) :9292-9310
[9]   STUDYING THE INTERFACE OF AU-CU SUPERLATTICES [J].
GLADYSZEWSKI, G .
THIN SOLID FILMS, 1989, 170 (01) :99-106
[10]   DETERMINATION OF ATOMIC DISPLACEMENT MODULATION IN MULTI-LAYER STRUCTURE BY X-RAY-DIFFRACTION [J].
HARADA, J ;
KASHIHARA, Y ;
SAKATA, M ;
MASHITA, M ;
ASHIZAWA, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (01) :L62-L64