Chemical and magnetization profile study of Ce in [CeLaCe/Fe] and [LaCeLa/Fe] multilayers by resonant X-ray reflectivity

被引：9

作者：

Jaouen, N

Tonnerre, JM

Bontempi, E

Raoux, D

Sève, L

Bartolomé, F

Rogalev, A

Müenzenberg, M

Felsch, W

Dürr, HA

Dudzik, E

Maruyama, H

机构：

[1] Univ Grenoble 1, CNRS, Lab Cristallog, F-38042 Grenoble 9, France

[2] ESRF, F-38042 Grenoble, France

[3] Univ Gottingen, Inst Phys 1, D-37073 Gottingen, Germany

[4] SERC, Daresbury Lab, CLCR, Synchrotron Rad Dpt, Warrington WA4 4AD, Cheshire, England

[5] Okayama Univ, Dept Phys, Okayama 7008530, Japan

来源：

PHYSICA B | 2000年 / 283卷 / 1-3期

关键词：

XMRS; magnetic multil layer; XMCD; interface roughness;

D O I：

10.1016/S0921-4526(99)01928-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The distribution of the induced 5d magnetic moments across the Ce layers in [CeLaCe/Fe](57) and [LaCeLa/Fe](57) multilayers has been investigated by resonant X-ray magnetic reflectivity. The quantitative analysis of the energy dependence of the asymmetry ratios measured on top of several multilayer Bragg peaks required the determination of the composition profile across the period of the multilayer. In order to separate out the structural parameters of the Ce and La layers, resonant X-ray reflectivity measurements were carried out at the La and Ce L-edges as well as at the Fe K-edge. The induced Ce 5d magnetic profile which is derived from the XRMS spectra is found to oscillate in both samples, with however, a different depth dependence probably related to the influence of the different interfaces. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：175 / 179

页数：5

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