Effect of beam energy and surface temperature on the dissociative adsorption of H2 on Si(001)

被引:54
作者
Dürr, M [1 ]
Raschke, MB [1 ]
Höfer, U [1 ]
机构
[1] Max Planck Inst Quantenopt, D-85740 Garching, Germany
关键词
D O I
10.1063/1.480395
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Dissociative adsorption of H-2 from a high-flux supersonic molecular beam on flat and vicinal Si(001) surfaces was investigated by means of optical second harmonic generation (SHG). The initial sticking coefficients for terrace adsorption varied between 10(-8) and 10(-4). They revealed a strongly activated dissociation process, both with respect to the kinetic energy of the incident molecules (70 meV less than or equal to E-kin less than or equal to 380 meV) and the surface temperature (440 K less than or equal to T-s less than or equal to 670 K). The results indicate that dynamical distortions of Si surface atoms can lower the effective adsorption barriers from 0.8 +/- 0.2 eV to almost negligible values. Previously proposed defect-mediated processes can be ruled out as a major adsorption channel. (C) 1999 American Institute of Physics. [S0021-9606(99)70747-6].
引用
收藏
页码:10411 / 10414
页数:4
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