Model for porous alumina template formation: constant voltage anodization

被引:6
作者
Singaraju, P. [1 ]
Venkat, R. [1 ]
Kanakala, R. [1 ]
Das, B. [1 ]
机构
[1] Univ Nevada, Dept Elect & Comp Engn, Las Vegas, NV 89154 USA
关键词
D O I
10.1051/epjap:2006081
中图分类号
O59 [应用物理学];
学科分类号
摘要
In spite of the extensive experimental investigations reported in the literature on porous alumina templates, the theoretical mechanisms, and their dependence on process parameters such as potential difference, current density and electrolytes, are not well understood. A theoretical model developed and published for porous structure formation under constant current electrochemical anodization of aluminum is adopted for constant voltage anodization. The model is based on the rate equation approach in which both the alumina formation and etching are considered. The model employs a minimal number of parameters and yet captures the essence of the experimental observations. The model yields an analytical solution relating the model parameters, process parameters and thickness of the film, which is easy to interpret and use. The results of normalized current versus time obtained from the model are in good agreement with the experimental results reported for a range of voltages, 20-40 V. It is also observed that the thickness of the Al2O3 pore follows V-1/2 behavior for anytime during the anodization.
引用
收藏
页码:107 / 111
页数:5
相关论文
共 14 条
[1]   Formation of porous silicon through the nanosized pores of an anodized alumina template [J].
Das, B ;
McGinnis, SP .
APPLIED PHYSICS LETTERS, 2003, 83 (14) :2904-2906
[2]   Broad band communication for multimedia applications [J].
Jain, PC ;
Singh, S ;
Prakash, VJ ;
Mitra, V .
IETE TECHNICAL REVIEW, 2002, 19 (1-2) :19-24
[3]   Modeling of porous alumina template formation under constant current conditions [J].
Kanakala, R ;
Singaraju, PV ;
Venkat, R ;
Das, B .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2005, 152 (01) :J1-J5
[4]   STRUCTURAL FEATURES OF OXIDE COATINGS ON ALUMINIUM [J].
KELLER, F ;
HUNTER, MS ;
ROBINSON, DL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1953, 100 (09) :411-419
[5]   Growth and characterization of a porous aluminum oxide film formed on an electrically insulating support [J].
Miney, PG ;
Colavita, PE ;
Schiza, MV ;
Priore, RJ ;
Haibach, FG ;
Myrick, ML .
ELECTROCHEMICAL AND SOLID STATE LETTERS, 2003, 6 (10) :B42-B45
[6]   THE OBSERVATION OF ANODIC OXIDE-FILMS ON ALUMINUM BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
ONO, S ;
ICHINOSE, H ;
KAWAGUCHI, T ;
MASUKO, N .
CORROSION SCIENCE, 1990, 31 :249-254
[7]  
Parkhutik V. P., 1992, J PHYS D, V25, P1253
[8]   STUDY OF ALUMINUM ANODIZATION IN SULFURIC AND CHROMIC-ACID SOLUTIONS .1. KINETICS OF GROWTH AND COMPOSITION OF OXIDES [J].
PARKHUTIK, VP ;
ALBELLA, JM ;
MAKUSHOK, YE ;
MONTERO, I ;
MARTINEZDUART, JM ;
SHERSHULSKII, VI .
ELECTROCHIMICA ACTA, 1990, 35 (06) :955-960
[9]   Nonlithographic nano-wire arrays: Fabrication, physics, and device applications [J].
Routkevitch, D ;
Tager, AA ;
Haruyama, J ;
Almawlawi, D ;
Moskovits, M ;
Xu, JM .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1996, 43 (10) :1646-1658
[10]  
SINES PB, 2001, THESIS W VIRGINIA U