Multivariate simulation assessment for virtual metrology

被引:14
作者
Chen, Yeh-Tung [1 ]
Yang, Haw-Ching [2 ]
Cheng, Fan-Tien [1 ]
机构
[1] Natl Cheng Kung Univ, Inst Mfg Engn, Tainan 70101, Taiwan
[2] Natl Kaohsiung First Univ Sci & Technol, Inst Syst & Control Engn, Kaohsiung, Taiwan
来源
2006 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION (ICRA), VOLS 1-10 | 2006年
关键词
Monte Carlo simulation; virtual metrology; sensitivity analysis;
D O I
10.1109/ROBOT.2006.1641848
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 [计算机科学与技术];
摘要
To reduce cost, this paper proposes a system architecture to simulate and assess the multivariate of equipment properties. The architecture integrates the Monte Carlo simulation, the Neural Network model and the sensitivity analysis to construct a virtual metrology system. By assuming the property's probability distribution, the architecture generates the extreme input data to supplement the actual data for enhancing the model accuracy and estimating the property trend. An industrial case applied to validate the proposed system architecture.
引用
收藏
页码:1048 / 1053
页数:6
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