Anomalous growth of whisker-like bismuth-tin extrusions from tin-enriched tin-Bi deposits

被引:26
作者
Hu, Chi-Chang [1 ]
Tsai, Yi-Da [2 ]
Lin, Chi-Cheng [2 ]
Lee, Gen-Lan [2 ]
Chen, Sinn-Wen [1 ]
Lee, Tai-Chou [2 ]
Wen, Ten-Chin [3 ]
机构
[1] Natl Tsing Hua Univ, Dept Chem Engn, Hsinchu 30013, Taiwan
[2] Natl Chung Cheng Univ, Dept Chem Engn, Chiayi 621, Taiwan
[3] Natl Cheng Kung Univ, Dept Chem Engn, Tainan 701, Taiwan
关键词
Metal extrusion; Sn-xBi deposit; Post-plating annealing; Lead-free solder; Electroplating;
D O I
10.1016/j.jallcom.2008.04.094
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This article shows the first finding that the anomalous growth of Bi-Sn extrusions from tin-enriched alloys (Sn-xBi with x between 20 and 10 wt.%) can be induced by post-plating annealing in N-2 between 145 and 260,C for 10 min although metal whiskers were commonly formed on the surface of pure metals or alloys of the enriched component. From SEM observations, very similar to Sn whiskers, Bi-Sn extrusions vary in size, shape, length, and diameter with changing the annealing temperature, which are highly important in regarding the potential for failure of electronic products. Annealing resulting in thermal expansion of Sn grains is believed to squeeze the Bi-Sn alloys with relatively low melting points to form whisker-like extrusions although the exact mechanism is unclear. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码:121 / 126
页数:6
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