Theory of semiconductor superjunction devices

被引:422
作者
Fujihira, T [1 ]
机构
[1] YAMANASHI UNIV,GRAD SCH ENGN,KOUFU 400,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 10期
关键词
semiconductor device; power device; superjunction; on-resistance; breakdown voltage; principle; theory; simulation;
D O I
10.1143/JJAP.36.6254
中图分类号
O59 [应用物理学];
学科分类号
摘要
A new theory of semiconductor devices, called ''semiconductor superjunction (SJ) theory''; is presented. To overcome the trade-off relationship between breakdown voltage and on-resistance of conventional semiconductor devices, SJ devices utilize a number of alternately stacked, p- and n-type, heavily doped, thin semiconductor layers. By controlling the degree of doping and the thickness of these layers, according to the SJ theory: this structure operates as a pn junction with low oil-resistance and high breakdown voltage, Analytical formulas for the ideal specific on-resistance and the ideal breakdown voltage of SJ devices are theoretically derived. Analysis based on the formulas and device simulations reveals that the all-resistance of SJ devices can be reduced to less than 10(-2) that of conventional devices.
引用
收藏
页码:6254 / 6262
页数:9
相关论文
共 15 条
[1]  
Ajit J. S., 1993, Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs ISPSD '93 (Cat. No.93CH3314-2), P230, DOI 10.1109/ISPSD.1993.297075
[2]  
[Anonymous], SOLID STATE ELECT
[3]  
[Anonymous], 1979, IEDM
[4]   THE INSULATED GATE TRANSISTOR - A NEW 3-TERMINAL MOS-CONTROLLED BIPOLAR POWER DEVICE [J].
BALIGA, BJ ;
ADLER, MS ;
LOVE, RP ;
GRAY, PV ;
ZOMMER, ND .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1984, 31 (06) :821-828
[5]  
CHANG HR, 1989, 175 SOC M LOS ANG 19, P86
[6]  
CHEN XB, 1993, Patent No. 5216275
[7]  
Coe D. J., 1982, European Patent, Patent No. [0 053 854 B1, 0053854]
[8]  
FUJIHARA T, JAPAN PATENT PENDING
[9]  
Hower P. L., 1983, International Electron Devices Meeting 1983. Technical Digest, P87
[10]  
Hu C, 1979, REC POW EL SPEC C, P385