Spectroellipsometric characterization of sol-gel TiO2-CuO thin coatings

被引：21

作者：

Gartner, M

Scurtu, R

Ghita, A

Zaharescu, M

Modreanu, M ^{[1
]}

Trapalis, C

Kokkoris, M

Kordas, G

机构：

[1] Natl Univ Ireland Univ Coll Cork, NMRC, Cork, Ireland

[2] Romanian Acad, Inst Phys Chem IG Murgulescu, Bucharest 77208, Romania

[3] Natl Ctr Sci Res, Inst Mat Sci, Athens 15310, Greece

来源：

THIN SOLID FILMS | 2004年 / 455卷

关键词：

TiO2-CuO; thin coatings; spectroscopic ellipsometry; sol-gel method;

D O I：

10.1016/j.tsf.2004.01.030

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

TiO2 based nanustructured coatings have been prepared by sol-gel method on glass and SiO2/glass substrates. The films were thermally treated in oxidative and reductive conditions at 500 degreesC. The influence of the substrate and of the thermal treatment on the optical properties of the films was studied. The samples were characterized by spectroscopic ellipsometry (SE), scanning electron microscopy (SEM), Rutherford backscattering spectroscopy (RBS) and Raman spectroscopy. SE results supported by other optical and structural measurements have proven the transformation of CuO from as-prepared samples into Cu2O in samples heated in oxidative conditions and into metallic Cu in samples heated in reductive conditions as well as the transformation of the amorphous TiO2 in anatase. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：417 / 421

页数：5

共 20 条

[1] INFLUENCE OF SUBSTRATE ON STRUCTURAL-PROPERTIES OF TIO2 THIN-FILMS OBTAINED VIA MOCVD [J].