Silicon-based polarization optics for the 1.30 and 1.55 mu m communication wavelengths

被引:6
作者
Azzam, RMA
Howlader, MMK
机构
[1] Department of Electrical Engineering, University of New Orleans, New Orleans
[2] University of Nebraska, Lincoln, NE
关键词
D O I
10.1109/50.495170
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A modular three-reflection prism of Si can be designed to function as an in-line (nondeviating) linear polarizer or quarterwave retarder at the 1.30 and 1.55 mu m lightwave communication wavelengths. Si-related thin films are employed as optical coatings. In particular, a single-layer antireflection coating of Si3N4 is used at the entrance and exit faces, and a SiO2 film controls the polarization and total internal reflection phase shifts at the side surfaces of the prism. The angular and wavelength sensitivity of these proposed Si-based polarization optical elements is also considered.
引用
收藏
页码:873 / 878
页数:6
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