Surface enhanced resonant Raman scattering induced by silver thin films close to the percolation threshold

被引：16

作者：

Gadenne, P

Gagnot, D

Masson, M

机构：

[1] CNRS,LAB MIXTE ST GOBAIN SURFACE & INTERFACE VERRE,AUBERVILLIERS 92,FRANCE

[2] UNIV PARIS 06,LAB DYNAM MATIERE CONDENSEE,F-75252 PARIS 05,FRANCE

来源：

PHYSICA A | 1997年 / 241卷 / 1-2期

关键词：

granular thin films; rough surface; resonant Raman scattering; percolation threshold;

D O I：

10.1016/S0378-4371(97)00076-9

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The electromagnetic field of an incoming wave has already been found to be enhanced close to the surface of a thin granular or rough silver film. We use Surface Enhanced Resonant Raman Scattering (SERRS) as a test of this enhancement close to the percolation threshold (p(c)). The scattered light shows a maximum below p(c), then a minimum close to p(c) and goes up above.

引用

收藏

页码：161 / 165

页数：5

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