Imaging Polymer Systems with High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HAADF-STEM)

被引:59
作者
Loos, Joachim [1 ,2 ,3 ,4 ]
Sourty, Erwan [1 ,2 ,5 ]
Lu, Kangbo [1 ,2 ,4 ]
de With, Gijsbertus [1 ,2 ]
v. Bavel, Svetlana [1 ,2 ,4 ]
机构
[1] Eindhoven Univ Technol, Lab Mat & Interface Chem, NL-5600 MB Eindhoven, Netherlands
[2] Eindhoven Univ Technol, Soft Matter CryoTEM Res Unit, NL-5600 MB Eindhoven, Netherlands
[3] Eindhoven Univ Technol, Lab Polymer Technol, NL-5600 MB Eindhoven, Netherlands
[4] Eindhoven Univ Technol, Dutch Polymer Inst, NL-5600 AX Eindhoven, Netherlands
[5] FEI Co, NL-5600 KA Eindhoven, Netherlands
关键词
X-RAY-SCATTERING; SOLAR-CELLS; MORPHOLOGY; IONOMERS;
D O I
10.1021/ma8026589
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
We have analyzed the nanoscale organization of various polymer systems by utilizing high-angle. annular dark field scanning transmission electron microscopy (HAADF-STEM). All systems under investigation are purely carbon based; in some cases staining was used for comparison with conventional transmission electron microscopy (CTEM) imaging. For contrast creation we have applied density differences rather than differences in elemental composition of the materials. Because HAADF-STEM is an incoherent imaging technique, which provides images easy to interpret clue to the lack of phase contrast, the high signal-to-noise ratio and the linearity of the signal intensity, imaging artifacts are substantially reduced and additional information on the nanoscale organization of polymer materials is obtained that is not accessible by CTEM. Exemplary, we present HAADF-STEM results form four different polymer systems-a rubber blend, a carbon black filled conductive nanocomposite, a functional blend as applied for the photoactive layer of a polymer solar cell, and semicrystalline polyethylene-and discuss critically contrast origin and the advantages of HAADF-STEM imaging for morphology characterization of polymer systems.
引用
收藏
页码:2581 / 2586
页数:6
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