Quantitative measurement of linear dielectric constant using scanning nonlinear dielectric microscopy with electro-conductive cantilever

被引：16

作者：

Ohara, K ^{[1
]}

Cho, Y ^{[1
]}

机构：

[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 7B期

关键词：

scanning nonlinear dielectric microscopy; quantitative measurement; linear dielectric constant;

D O I：

10.1143/JJAP.41.4961

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A quantitative measurement method of the linear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO2-Bi2Ti4O11 ceramics with higher resolution than that obtained with needle-type SNDM.

引用

页码：4961 / 4964

页数：4

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