共 11 条
[2]
Cho Y., 1998, Oyo Buturi, V67, P327
[3]
DYNAMIC MEASURING METHOD OF CAPACITANCE VARIATION OF PIEZOELECTRIC CERAMICS WITH ALTERNATING ELECTRIC-FIELD
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1992, 31 (11)
:3627-3631
[4]
Observation of ultrathin single-domain layers formed on LiTaO3 and LiNbO3 surfaces using scanning nonlinear dielectric microscope with submicron resolution
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1999, 38 (5B)
:3279-3282
[5]
New microscope for measuring the distribution of nonlinear dielectric properties
[J].
ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS,
1996, 79 (06)
:68-75
[6]
Scanning nonlinear dielectric microscope using a lumped constant resonator probe and its application to investigation of ferroelectric polarization distributions
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1997, 36 (5B)
:3152-3156
[7]
Cho Y., 1995, Transactions of the Institute of Electronics, Information and Communication Engineers C-I, VJ78C-I, P593
[8]
Scanning nonlinear dielectric microscope
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1996, 67 (06)
:2297-2303
[9]
Scanning nonlinear dielectric microscope with submicron resolution
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
1998, 37 (5B)
:3132-3133
[10]
Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
1999, 38 (9B)
:5689-5694