Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

被引:33
作者
Cho, YS [1 ]
Kazuta, S [1 ]
Ohara, K [1 ]
Odagawa, H [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 5B期
关键词
scanning nonlinear dielectric microscopy; quantitative measurement; linear dielectric constant; nonlinear dielectric constant;
D O I
10.1143/JJAP.39.3086
中图分类号
O59 [应用物理学];
学科分类号
摘要
The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants nf dielectric materials were performed successfully.
引用
收藏
页码:3086 / 3089
页数:4
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