Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy

被引：33

作者：

Cho, YS ^{[1
]}

Kazuta, S ^{[1
]}

Ohara, K ^{[1
]}

Odagawa, H ^{[1
]}

机构：

[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 5B期

关键词：

scanning nonlinear dielectric microscopy; quantitative measurement; linear dielectric constant; nonlinear dielectric constant;

D O I：

10.1143/JJAP.39.3086

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The theory for quantitative measurement of linear and nonlinear dielectric constants using scanning nonlinear dielectric microscopy is explained in this paper. Using this theory, quantitative measurements for linear and nonlinear dielectric constants nf dielectric materials were performed successfully.

引用

页码：3086 / 3089

页数：4

共 11 条

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