Spectropolarimetric reflectometer

被引：24

作者：

Goldstein, DH

Chenault, DB

机构：

[1] USAF, Res Lab, Eglin AFB, FL 32542 USA

[2] SY Technol Inc, Huntsville, AL 35806 USA

来源：

OPTICAL ENGINEERING | 2002年 / 41卷 / 05期

关键词：

polarimetry; Mueller matrix; reflectometer; spectropolarimetry;

D O I：

10.1117/1.1467933

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An instrument is presented that combines the functions of a reflectometer, a spectrometer, and a polarimeter. A Fourier transform spectrometer serves as a light source for a dual rotating retarder polarimeter. Operation of the instrument results in measurement of the complete Mueller matrix of a sample in reflection over a wide spectral band, Calibration and error compensation is described. Polarization characteristics of materials in reflection are determined. (C) 2002 Society of Photo-Optical Instrumentation Engineers.

引用

页码：1013 / 1020

页数：8

共 13 条

[1] PHOTOPOLARIMETRIC MEASUREMENT OF MUELLER MATRIX BY FOURIER-ANALYSIS OF A SINGLE DETECTED SIGNAL [J].

AZZAM, RMA .

OPTICS LETTERS, 1978, 2 (06) :148-150

[2]

CHENAULT DB, 1992, P SOC PHOTO-OPT INS, V1746, P231, DOI 10.1117/12.138793

[3]

CHENUALT DB, 1990, Patent No. 4961634

[4] ERROR ANALYSIS OF A MUELLER MATRIX POLARIMETER [J].

GOLDSTEIN, DH ;

CHIPMAN, RA .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1990, 7 (04) :693-700

[5] MUELLER MATRIX DUAL-ROTATING RETARDER POLARIMETER [J].

GOLDSTEIN, DH .

APPLIED OPTICS, 1992, 31 (31) :6676-6683

[6] Polarimetric characterization of Spectralon [J].

Goldstein, DH ;

Chenault, DB ;

Pezzaniti, L .

POLARIZATION: MEASUREMENT, ANALYSIS, AND REMOTE SENSING II, 1999, 3754 :126-136

[7] Polarimetric characterization of federal standard paints [J].

Goldstein, DH .

POLARIZATION ANALYSIS, MEASUREMENT, AND REMOTE SENSING III, 2000, 4133 :112-123

[8] INFRARED SPECTROPOLARIMETRY [J].

GOLDSTEIN, DH ;

CHIPMAN, RA ;

CHENAULT, DB .

OPTICAL ENGINEERING, 1989, 28 (02) :120-125

[9] Evaluation of a selection of commercial polarizers and retarders at visible and near infrared wavelengths [J].

Goldstein, DH ;

Chenault, DB ;

Owens, MA .

POLARIZATION: MEASUREMENT, ANALYSIS, AND REMOTE SENSING, 1997, 3121 :203-212

[10]

Goldstein DH, 1991, US Patent, Patent No. [5,045,701, 5045701]

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