Study of buried junction and uniformity effects in CdTe/CdS solar cells using a combined OBIC and EQE apparatus

被引：25

作者：

Major, J. D. ^{[1
]}

Durose, K. ^{[1
]}

机构：

[1] Univ Durham, Dept Phys, Durham DH1 3LE, England

来源：

THIN SOLID FILMS | 2009年 / 517卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

CdTe; Solar; OBIC; PHOTOCURRENT;

D O I：

10.1016/j.tsf.2008.11.052

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A study of junction position and uniformity in CdTe/CdS solar cells is reported in which the influence of excluding oxygen from the CdS layers was investigated. The samples were characterised with an optical beam induced current instrument capable of mapping the cell response in the range 400-900 mu m at a resolution of 12.5 mu m - either as a map or a quantum efficiency spectrum. For oxygen-free CdS, the junctions were always buried in the CdTe - at a depth presumed to be controlled by the chloride treatment. If CdS:O is used then shallow junctions result, indicating that such layers have a role in doping the devices. The wavelength dependence of the spatial uniformity of the cell's responses is also discussed. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：2419 / 2422

页数：4

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