Investigations into local ferroelectric properties by atomic force microscopy

被引：17

作者：

Durkan, C ^{[1
]}

Welland, ME ^{[1
]}

机构：

[1] Univ Cambridge, Dept Engn, Nanoscale Sci Grp, Cambridge CB2 1PZ, England

来源：

ULTRAMICROSCOPY | 2000年 / 82卷 / 1-4期

关键词：

D O I：

10.1016/S0304-3991(99)00134-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

In this article, we describe nanometer scale characterization of piezoelectric thin films of Lead-Zirconate-Titanate (PZT). Using the electric field from a biased conducting atomic-force microscopy (AFM) tip, we show that it is possible to form and subsequently image ferroelectric domains. Using a sphere-plane model for the tip-sample system we calculate the distribution of electric potential, field and polarization charge, and find good agreement with the experimental values. We also discuss the effects of surface contaminants on domain formation. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：141 / 148

页数：8

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