KELVIN PROBE FORCE MICROSCOPY

被引：1902

作者：

NONNENMACHER, M

OBOYLE, MP

WICKRAMASINGHE, HK

机构：

来源：

APPLIED PHYSICS LETTERS | 1991年 / 58卷 / 25期

关键词：

D O I：

10.1063/1.105227

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension ( < 50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.

引用

页码：2921 / 2923

页数：3

共 16 条

[1] BENETT AJ, 1967, PHYS REV, V160, P541
[2] Craig P. P., 1970, Review of Scientific Instruments, V41, P258, DOI 10.1063/1.1684484
[3] Ertl G., 1974, MONOGRAPHS MODERN CH, V4
[4] HIGH-RESOLUTION CAPACITANCE MEASUREMENT AND POTENTIOMETRY BY FORCE MICROSCOPY
MARTIN, Y
ABRAHAM, DW
WICKRAMASINGHE, HK
[J]. APPLIED PHYSICS LETTERS, 1988, 52 (13) : 1103 - 1105
[5] ATOMIC FORCE MICROSCOPE FORCE MAPPING AND PROFILING ON A SUB 100-A SCALE
MARTIN, Y
WILLIAMS, CC
WICKRAMASINGHE, HK
[J]. JOURNAL OF APPLIED PHYSICS, 1987, 61 (10) : 4723 - 4729
[6] MCCLELLAND GM, 1987, REV PROGR QUANTITA B, V6, P307
[7] SCANNING FORCE MICROSCOPY WITH MICROMACHINED SILICON SENSORS
NONNENMACHER, M
GRESCHNER, J
WOLTER, O
KASSING, R
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 1358 - 1362
[8] NONNENMACHER M, 1990, THESIS U KASSEL W GE
[9] WORK FUNCTION OF GOLD
SACHTLER, WM
DORGELO, GJH
HOLSCHER, AA
[J]. SURFACE SCIENCE, 1966, 5 (02) : 221 - &
[10] OBSERVATION OF SINGLE CHARGE-CARRIERS BY FORCE MICROSCOPY
SCHONENBERGER, C
ALVARADO, SF
[J]. PHYSICAL REVIEW LETTERS, 1990, 65 (25) : 3162 - 3164

← 1 2 →