Dose-rate dependence of electron-induced mass loss from organic specimens

被引:38
作者
Egerton, RF [1 ]
Rauf, I [1 ]
机构
[1] Univ Alberta, Dept Phys, Fac Sci, Avadh Bhatia Phys Lab 412, Edmonton, AB T6G 2J1, Canada
基金
加拿大自然科学与工程研究理事会;
关键词
electron energy loss spectroscopy (EELS); radiation effects (experimental);
D O I
10.1016/S0304-3991(99)00114-X
中图分类号
TH742 [显微镜];
学科分类号
摘要
Electron energy-loss measurements on thin films of collodion at low temperatures (90 K) show that the characteristic electron dose D-c for mass loss first increases and then decreases with increasing dose rate (current density). This behaviour is explained in terms of the limited diffusion rates at low specimen temperature and the heating effect of the electron beam, and can be approximately modelled using a simple computer program. For a small-diameter electron probe, the increase in D-c can be several orders of magnitude, suggesting a substantial advantage of STEM tin comparison to fixed-beam TEM) for examining beam-sensitive specimens. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:247 / 254
页数:8
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