共 11 条
[2]
BINNIG G, 1992, ULTRAMICROSCOPY, V42, P281
[5]
ULTRAHIGH-VACUUM SCANNING FORCE MICROSCOPY - ATOMIC-SCALE RESOLUTION AT MONATOMIC CLEAVAGE STEPS
[J].
PHYSICAL REVIEW B,
1994, 49 (08)
:5651-5656
[6]
ATOMIC-FORCE MICROSCOPY AND REAL ATOMIC-RESOLUTION - SIMPLE COMPUTER-SIMULATIONS
[J].
EUROPHYSICS LETTERS,
1994, 26 (02)
:103-107
[9]
OBSERVATION OF ATOMIC DEFECTS ON LIF(100) SURFACE WITH ULTRAHIGH-VACUUM ATOMIC-FORCE MICROSCOPE (UHV AFM)
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
1993, 32 (6B)
:2980-2982