Antiferromagnetic thickness dependence of exchange biasing

被引：99

作者：

Xi, HW ^{[1
]}

White, RM ^{[1
]}

机构：

[1] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA

来源：

PHYSICAL REVIEW B | 2000年 / 61卷 / 01期

关键词：

D O I：

10.1103/PhysRevB.61.80

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A theory for a ferromagnetic/antiferromagnetic (FM/AF) exchange coupled bilayer of finite thickness is presented. Calculations based on this theory describe the reversible and irreversible transitions of the magnetic moments in this FM/AF system. A description of the exchange bias effect is offered that explains the observed phenomena of enhanced coercivity and rotational hysteresis. The theory also explains the AF thickness dependence of the exchange field and the coercivity.

引用

页码：80 / 83

页数：4

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