Surface forces in colloidal processing with nano-particles

被引：8

作者：

Lee, SW ^{[1
]}

Cho, JM ^{[1
]}

Sigmund, WM ^{[1
]}

机构：

[1] Univ Florida, Dept Mat Sci & Engn, Gainesville, FL 32611 USA

来源：

MATERIALS AND MANUFACTURING PROCESSES | 2002年 / 17卷 / 04期

基金：

美国国家科学基金会;

关键词：

surface forces; colloidal processing; nano-particle; van der Waals interaction; colloidal stability; surface force measurement; atomic force microscope; carbon nanotube;

D O I：

10.1081/AMP-120014239

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Surface forces acting between particles and different contributions to the forces are outlined with particular attention paid to the colloidal stability with nanosize particles. This is followed by a discussion of surface forces for nanosize particles and an introduction of a novel nanosize colloidal probe technique in an atomic force microscope.

引用

页码：543 / 551

页数：9

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